ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,898, issued on May 5, was assigned to Synopsys Inc. (Sunnyvale, Calif.). "Neighborhood built-in self-test noise generation" was invented by A... Read More
ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,899, issued on May 5, was assigned to JF MICROTECHNOLOGY SDN. BHD. (Petaling Jaya, Malaysia). "Method for aligning contact pins in an integra... Read More
ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,900, issued on May 5, was assigned to Intel Corp. (Santa Clara, Calif.). "Wafer level electron beam prober" was invented by Xianghong Tong (H... Read More
ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,901, issued on May 5, was assigned to SAMSUNG SDI Co. LTD. (Yongin-si, South Korea). "Battery management module and method for detecting defe... Read More
ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,902, issued on May 5, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Probe card including power compensation circuit ... Read More
ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,903, issued on May 5, was assigned to Georgia Tech Research Corp. (Atlanta). "System and methods for measuring arc duration" was invented by ... Read More
ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,904, issued on May 5, was assigned to South China University of Technology (Guangzhou City, China). "Valve-level fault location method and sy... Read More
ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,905, issued on May 5, was assigned to QINGDAO UNIVERSITY (Qingdao, China). "Superconducting motor quench detection method and apparatus based... Read More
ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,906, issued on May 5, was assigned to Samsung SDI Co. Ltd. (Yongin-si, South Korea). "Method for estimating state of charge of battery" was i... Read More
ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,907, issued on May 5, was assigned to Robert Bosch GmbH (Stuttgart, Germany). "Method and device for detecting a critical anomaly in a device... Read More